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dc.contributor.authorMosiori, Cliff Orori
dc.contributor.authorKwembur, Isaac Morko
dc.contributor.authorMaera, John
dc.date.accessioned2017-06-16T06:24:31Z
dc.date.available2017-06-16T06:24:31Z
dc.date.issued2016-01
dc.identifier.issn2319-6491
dc.identifier.urihttp://hdl.handle.net/123456789/7920
dc.description.abstractCdS thin films were grown on highly cleaned substrates of Microscope glass slides using solution deposition technique at different molar concentrations at constant time and repeated at a fixed molar concentration at for different deposition times. Measurement of the thermal emittance on polished and coated substrates was determined before and after growth. The average thermal emittance value of polished uncoated sample plate was0.152 with an error of ± 0.013 while an average thermal emittance value of the coated sample was 0.15 ± 0.01. Equally when the average solar absorptance values of the coated sample plate substrate was 0.473 with an error of ± 0.01. Thin film thickness varied from 0.212-0.614 μm with an error of ± 0.01. These outcomes formed the basis for proposing these thin films as appropriate for photothermal solar energy applicationen_US
dc.description.sponsorshipTECHNICAL UNIVERSITY OF MOMBASAen_US
dc.language.isoenen_US
dc.publisherInternational Journal of Engineering Inventionsen_US
dc.subjectThermal emmittance, Solar absorptance, Solar thermal devicesen_US
dc.titleThermal Emmittance and Solar absorptance of CDS Thin Filmsen_US
dc.typeArticleen_US


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